Study on Test Data Reduction Combining Illinois Scan and Bit Flipping
نویسندگان
چکیده
منابع مشابه
Bit-Flipping Scan - A unified architecture for fault tolerance and offline test
Test is an essential task since the early days of digital circuits. Every produced chip undergoes at least a production test supported by on-chip test infrastructure to reduce test cost. Throughout the technology evolution fault tolerance gained importance and is now necessary in many applications to mitigate soft errors threatening consistent operation. While a variety of effective solutions e...
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ژورنال
عنوان ژورنال: IEICE Transactions on Information and Systems
سال: 2008
ISSN: 0916-8532,1745-1361
DOI: 10.1093/ietisy/e91-d.3.720